Development of a Universal Platform for Hardware In-the-Loop Testing of Microgrids

Wang, Jing; Song, Yulun; Li, Wendong; Guo, Li; Monti, Antonello

New York, NY : IEEE (2014)
Journal Article

In: IEEE transactions on industrial informatics
Volume: 10
Issue: 4
Page(s)/Article-Nr.: 2154-2165