Development of a Universal Platform for Hardware In-the-Loop Testing of Microgrids

New York, NY / IEEE (2014) [Journal Article]

IEEE transactions on industrial informatics
Volume: 10
Issue: 4
Page(s): 2154-2165

Authors

Selected Authors

Wang, Jing
Song, Yulun
Li, Wendong
Guo, Li
Monti, Antonello

Identifier