Methodology for Reliability Analysis of Cyber-Physical MTdc Grids

Sadu, Abhinav (Corresponding author); Roy, Gaurav Kumar; Ponci, Ferdinanda; Monti, Antonello

New York, NY] : IEEE (2020, 2021)
Journal Article

In: IEEE journal of emerging and selected topics in power electronics
Volume: 9
Issue: 5
Page(s)/Article-Nr.: 5228-5238

Identifier