Methodology for Reliability Analysis of Cyber-Physical MTdc Grids
Sadu, Abhinav (Corresponding author); Roy, Gaurav Kumar; Ponci, Ferdinanda; Monti, Antonello
New York, NY] : IEEE (2020, 2021)
Journal Article
In: IEEE journal of emerging and selected topics in power electronics
Volume: 9
Issue: 5
Page(s)/Article-Nr.: 5228-5238
Identifier
- DOI: 10.1109/JESTPE.2020.2976748
- RWTH PUBLICATIONS: RWTH-2021-11134