Characterization and comparison of high blocking voltage IGBTs and IEGTs under hard- and soft-switching conditions

Piscataway, N.J / IEEE Operations Center (2006) [Contribution to a conference proceedings]

2006 IEEE Power Electronics Specialists Conference : 18 - 22 June 2006, Jeju, Korea. - Vol. 1-7
Page(s): 1368-1374


Selected Authors

Köllensperger, Peter
de Doncker, Rik W.
Fujii, Kansuke